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KMID : 0385520020150020108
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Analytical Science & Technology
2002 Volume.15 No. 2 p.108 ~ p.114
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Study for Conductive and Non-conductive Multi-layers Depth Profiling Analysis of Radio Frequency Gas-jet Boosted Glow Discharge Spectrometry
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조원보/Cho WB
스튜어드 보든/정종필/강원규/김규환/김효진/Borden S/Jeong JP/Kang WK/Kim KW/Kim HJ
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Abstract
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KEYWORD
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